*
**

Materiałoznawstwo

Ta strona nie jest obecnie dostępna w Twoim języku. Możesz zapoznać się z tłumaczeniem automatycznym, korzystając z usługi Google Translate. Nie jesteśmy odpowiedzialni za świadczenie tej usługi, ani też wyniki tłumaczenia nie były przez nas sprawdzane.
Jeżeli chciałbyś uzyskać więcej pomocy skontaktuj się z nami.

Image of SEM-SCA system

Material science provides a varied and challenging range of samples for spectroscopic analysis which is ideally suited to the versatility offered by Renishaw's inVia Raman microscope. Typical materials include composites, polymers and catalyst reagents. Many of these samples can benefit from a second, complementary analysis technique, such as the pioneering structural and chemical analyser, or SEM-SCA, a combination of scanning electron microscope (SEM) and microRaman capabilities

For example, a recent case study involved the use of Renishaw Raman technology to investigate a crack in a steel component from a nuclear reactor. It was thought, and confirmed by initial microRaman analysis, that the cracking was caused by oxidation induced brittleness. In order to understand more fully the processes involved in this degradation, and hence allow preventative steps to be initiated, a more detailed analysis was required. The large depth of field and chemical analysis on the micron scale afforded by the SEM-SCA successfully facilitated this specific analysis. For more examples of material analysis using SEM-SCA and combined FT-IR Raman systems, please download the relevant document.

Please note that document downloads require registration.

Documents for download

 

SEM image of wire fracture

 

SCA oxidation application notes - copper and steel

This note illustrates how the SEM-SCA can be used to study the corrosion of copper wire and nuclear reactor steel (four pages).

[345KB]

Adobe acrobat PDF

Raman image of a diamond film

 

Crystal structure and Raman scattering

Applications of Raman spectroscopy for polymorph identification, with example materials such as Titanium Oxide, Carbon films, Silicon carbide and amiloride hydrogen chloride.

[122KB]

Adobe acrobat PDF

Preview of 'New tools' flyer

 

 

 

Combined SEM and optical spectroscopy: new tools for characterising materials

One page document illustrating the use of Renishaw's SEM-SCA to characterise materials, using results from a diamond film as examples.

[808KB]

Adobe acrobat PDF

Preview: Structural and Chemical Analysiser for SEM

 

 

Structural and chemical analyser for SEM

One page document illustrating the use of the SEM-SCA for analysing cemented diamond composites.

[705KB]

Adobe acrobat PDF

Preview of brominated flame retardants detection flyer  

Rapid detection of brominated flame retardants

One page document illustrating the use of Raman for detecting materials such as polybromodiphenyl ethers.

[79KB]

Adobe acrobat PDF

 

Selected publications

Advances in the Raman depth profiling of polymer laminates (2003), C Froud et al, Applied Spectroscopy, 57,12,1468-1474

Transmission electron microscope radiation damage of 4H and 6H SiC by photoluminescence spectroscopy (2002), J Steeds et al, Diamond and related materials, 11, 1923-1945

Następne kroki

Skontaktuj się z nami online, jeżeli potrzebujesz więcej informacji lub masz zapytanie o cenę bądź, alternatywnie, chciałbyś rozmawiać bezpośrednio ze swym lokalnym biurem Renishaw.


*

Zasoby

Dokumenty do pobrania

Newsletter

All the latest innovations in Raman spectroscopy - newsletter sign up here

Download past and present newsletters from our Newsletter archive

StreamLine™ Plus fast Raman imagingStreamLine™ image of a tablet

Renishaw's flexible and fast Raman imaging system

Raman image gallery

Silicon indent - peak position mapBrowse the Raman image gallery